TOPOLOGICAL IMAGE PROCESSING FOR COMPREHENSIVE DEFECT AND DEVIATION ANALYSIS USING ADAPTIVE BINARISATION


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Authors

  • Igor NEVLIUDOV Department of Сomputer-Integrated Technologies, Automation and Mechatronics; Kharkiv National University of Radio Electronics, Kharkiv, Ukraine
  • Igor BADANYUK Department of Сomputer-Integrated Technologies, Automation and Mechatronics; Kharkiv National University of Radio Electronics, Kharkiv, Ukraine
  • Dmytro NIKITIN Department of Сomputer-Integrated Technologies, Automation and Mechatronics; Kharkiv National University of Radio Electronics, Kharkiv, Ukraine

DOI:

https://doi.org/10.5281/zenodo.8098602

Keywords:

Process image processing, Adaptive binarization, Otsu method, GP topology, Finding

Abstract

PCB topology image processing is an important component of Industry 4.0, as images can be used for automated quality control and visual inspection of manufacturing processes related to PCB production. Image processing can be used to control the quality of printed circuit boards, for example, to detect defects that may be invisible to the human eye.

The main objective of the study is to improve the method of adaptive binarization for images obtained by technical vision systems by developing an automatic algorithm for detecting the required value of the image binarization window. To achieve this goal, it was decided to develop an algorithm for automatically finding the size of the scanning area in adaptive binarization for processing technological images of the SOE topology.

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Published

2023-06-30

How to Cite

NEVLIUDOV, I., BADANYUK, I., & NIKITIN, D. (2023). TOPOLOGICAL IMAGE PROCESSING FOR COMPREHENSIVE DEFECT AND DEVIATION ANALYSIS USING ADAPTIVE BINARISATION. Journal of Natural Sciences and Technologies, 2(1), 183–186. https://doi.org/10.5281/zenodo.8098602

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