TOPOLOGICAL IMAGE PROCESSING FOR COMPREHENSIVE DEFECT AND DEVIATION ANALYSIS USING ADAPTIVE BINARISATION
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https://doi.org/10.5281/zenodo.8098602Keywords:
Process image processing, Adaptive binarization, Otsu method, GP topology, FindingAbstract
PCB topology image processing is an important component of Industry 4.0, as images can be used for automated quality control and visual inspection of manufacturing processes related to PCB production. Image processing can be used to control the quality of printed circuit boards, for example, to detect defects that may be invisible to the human eye.
The main objective of the study is to improve the method of adaptive binarization for images obtained by technical vision systems by developing an automatic algorithm for detecting the required value of the image binarization window. To achieve this goal, it was decided to develop an algorithm for automatically finding the size of the scanning area in adaptive binarization for processing technological images of the SOE topology.
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