NEVLIUDOV, I.; BADANYUK, I.; NIKITIN, D. TOPOLOGICAL IMAGE PROCESSING FOR COMPREHENSIVE DEFECT AND DEVIATION ANALYSIS USING ADAPTIVE BINARISATION. Journal of Natural Sciences and Technologies, [S. l.], v. 2, n. 1, p. 183–186, 2023. DOI: 10.5281/zenodo.8098602. Disponível em: https://journalofnastech.com/index.php/pub/article/view/26. Acesso em: 21 nov. 2024.