NEVLIUDOV, I., BADANYUK, I. and NIKITIN, D. 2023. TOPOLOGICAL IMAGE PROCESSING FOR COMPREHENSIVE DEFECT AND DEVIATION ANALYSIS USING ADAPTIVE BINARISATION. Journal of Natural Sciences and Technologies. 2, 1 (Jun. 2023), 183–186. DOI:https://doi.org/10.5281/zenodo.8098602.